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"A structure and technique for pseudorandom-based testing of sequential ..."

Fidel Muradali, Takao Nishida, Tsuguo Shimizu (1995)

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DOI: 10.1007/BF00993133

access: closed

type: Journal Article

metadata version: 2020-09-11

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Fidel Muradali, Takao Nishida, Tsuguo Shimizu:
A structure and technique for pseudorandom-based testing of sequential circuits. J. Electron. Test. 6(1): 107-115 (1995)

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