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"Structural Test Approach for Embedded Analog Circuits Based on a Built-in ..."

Román Mozuelos et al. (2011)

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DOI: 10.1007/S10836-011-5214-Y

access: closed

type: Journal Article

metadata version: 2020-09-11

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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho:
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor. J. Electron. Test. 27(2): 177-192 (2011)

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