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"An Efficient VLSI Test Data Compression Scheme for Circular Scan ..."

Sanjoy Mitra, Debaprasad Das (2020)

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DOI: 10.1007/S10836-020-05880-7

access: closed

type: Journal Article

metadata version: 2020-09-11

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Sanjoy Mitra, Debaprasad Das:
An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic. J. Electron. Test. 36(3): 327-342 (2020)

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