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"The Role of Test Protocols in Automated Test Generation for ..."

Erik Jan Marinissen (2002)

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DOI: 10.1023/A:1016545607915

access: closed

type: Journal Article

metadata version: 2024-02-05

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Erik Jan Marinissen:
The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs. J. Electron. Test. 18(4-5): 435-454 (2002)

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