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"Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs."

Yuhai Ma, Wanchun Shi (1999)

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DOI: 10.1023/A:1008318421537

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yuhai Ma, Wanchun Shi:
Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs. J. Electron. Test. 14(3): 273-293 (1999)

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