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"A New Optimal Test Node Selection Method for Analog Circuit."

Hui Luo et al. (2012)

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DOI: 10.1007/S10836-011-5274-Z

access: closed

type: Journal Article

metadata version: 2020-09-11

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Hui Luo, Youren Wang, Hua Lin, Yuanyuan Jiang:
A New Optimal Test Node Selection Method for Analog Circuit. J. Electron. Test. 28(3): 279-290 (2012)

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