"Design and Temperature Reliability Testing for A 0.6-2.14GHz Broadband ..."

Qian Lin et al. (2016)

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DOI: 10.1007/S10836-016-5571-7

access: closed

type: Journal Article

metadata version: 2020-09-11

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Qian Lin, Qian-Fu Cheng, Junjie Gu, Yuanyuan Zhu, Chao Chen, Haipeng Fu:
Design and Temperature Reliability Testing for A 0.6-2.14GHz Broadband Power Amplifier. J. Electron. Test. 32(2): 235-240 (2016)

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