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"Selection of Crosstalk-Induced Faults in Enhanced Delay Test."

Huawei Li, Xiaowei Li (2005)

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DOI: 10.1007/S10836-005-6147-0

access: closed

type: Journal Article

metadata version: 2023-05-11

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Huawei Li, Xiaowei Li:
Selection of Crosstalk-Induced Faults in Enhanced Delay Test. J. Electron. Test. 21(2): 181-195 (2005)

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