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"A Heuristic Measure to Maximize Detected Faults per Test."

Kim T. Le, Kewal K. Saluja (1998)

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DOI: 10.1023/A:1008389217344

access: closed

type: Journal Article

metadata version: 2020-09-11

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Kim T. Le, Kewal K. Saluja:
A Heuristic Measure to Maximize Detected Faults per Test. J. Electron. Test. 13(1): 57-60 (1998)

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