"Efficient sensitization of multi-bit-paths for testing embedded modules in ..."

Konstantin Keutner, Erwin Trischler (1995)

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DOI: 10.1007/BF00993129

access: closed

type: Journal Article

metadata version: 2020-09-11

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Konstantin Keutner, Erwin Trischler:
Efficient sensitization of multi-bit-paths for testing embedded modules in synchronous sequential circuits. J. Electron. Test. 6(1): 45-58 (1995)

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