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"Boundary scan test, test methodology, and fault modeling."

Frans Jong, José S. Matos, José M. Ferreira (1991)

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DOI: 10.1007/BF00134944

access: closed

type: Journal Article

metadata version: 2020-09-11

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Frans Jong, José S. Matos, José M. Ferreira:
Boundary scan test, test methodology, and fault modeling. J. Electron. Test. 2(1): 77-88 (1991)

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