"Methods of Testing Discrete Semiconductors in the 1149.4 Environment."

Jari Hannu, Markku Moilanen (2007)

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DOI: 10.1007/S10836-007-5007-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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Jari Hannu, Markku Moilanen:
Methods of Testing Discrete Semiconductors in the 1149.4 Environment. J. Electron. Test. 23(6): 581-592 (2007)

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