"An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults ..."

Mousum Handique, Jatindra Kumar Deka, Santosh Biswas (2020)

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DOI: 10.1007/S10836-020-05855-8

access: closed

type: Journal Article

metadata version: 2020-09-11

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Mousum Handique, Jatindra Kumar Deka, Santosh Biswas:
An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits. J. Electron. Test. 36(1): 105-122 (2020)

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