"Multi-VDD Testing for Analog Circuits."

José Pineda de Gyvez, Guido Gronthoud, Rashid Amine (2005)

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DOI: 10.1007/S10836-005-6360-X

access: closed

type: Journal Article

metadata version: 2020-09-11

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José Pineda de Gyvez, Guido Gronthoud, Rashid Amine:
Multi-VDD Testing for Analog Circuits. J. Electron. Test. 21(3): 311-322 (2005)

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