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"A Low-Cost Test Methodology for Dynamic Specification Testing of ..."

Shalabh Goyal, Abhijit Chatterjee, Michael Purtell (2007)

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DOI: 10.1007/S10836-006-9523-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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Shalabh Goyal, Abhijit Chatterjee, Michael Purtell:
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. J. Electron. Test. 23(1): 95-106 (2007)

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