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"Sequential Circuit Test Generation Using a Symbolic/Genetic Hybrid Approach."

Franco Fummi et al. (2001)

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DOI: 10.1023/A:1012275631257

access: closed

type: Journal Article

metadata version: 2020-09-11

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Franco Fummi, Marco Boschini, Xiaoming Yu, Elizabeth M. Rudnick:
Sequential Circuit Test Generation Using a Symbolic/Genetic Hybrid Approach. J. Electron. Test. 17(3-4): 321-330 (2001)

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