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"Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes."

Renan Alves Fonseca et al. (2012)

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DOI: 10.1007/S10836-012-5291-6

access: closed

type: Journal Article

metadata version: 2023-03-21

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  - https://dblp.org/rec/journals/et/FonsecaDBGPVB12
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine:
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes. J. Electron. Test. 28(3): 317-329 (2012)

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