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"Current testing in dynamic CMOS circuits."

Joan Figueras, Michel Renovell (1995)

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DOI: 10.1007/BF00993135

access: closed

type: Journal Article

metadata version: 2020-09-11

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Joan Figueras, Michel Renovell:
Current testing in dynamic CMOS circuits. J. Electron. Test. 6(1): 127-131 (1995)

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