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ORCID"Using At-Speed BIST to Test LVDS Serializer/Deserializer Function."
Magnus Eckersand, Fredrik Franzon, Ken Filliter (2002)
- Magnus Eckersand, Fredrik Franzon, Ken Filliter:
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function. J. Electron. Test. 18(2): 171-177 (2002)
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