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"Design of testable sequential circuits by repositioning flip-flops."

Sujit Dey, Srimat T. Chakradhar (1995)

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DOI: 10.1007/BF00993318

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/DeyC95
Sujit Dey, Srimat T. Chakradhar:
Design of testable sequential circuits by repositioning flip-flops. J. Electron. Test. 7(1-2): 105-114 (1995)

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