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"Analog Circuit Test Point Selection Incorporating Discretization-Based ..."
Yiqian Cui, Junyou Shi, Zili Wang (2016)
- Yiqian Cui, Junyou Shi, Zili Wang:
Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances. J. Electron. Test. 32(6): 661-679 (2016)
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