"Testing for Interconnect Crosstalk Defects Using On-Chip Embedded ..."

Li Chen, Xiaoliang Bai, Sujit Dey (2002)

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DOI: 10.1023/A:1016562011549

access: closed

type: Journal Article

metadata version: 2020-09-11

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Li Chen, Xiaoliang Bai, Sujit Dey:
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores. J. Electron. Test. 18(4-5): 529-538 (2002)

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