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"Analysis and Detection of Open-gate Defects in Redundant Structures of a ..."

Víctor H. Champac et al. (2021)

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DOI: 10.1007/S10836-021-05955-Z

access: closed

type: Journal Article

metadata version: 2021-09-03

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Víctor H. Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas:
Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell. J. Electron. Test. 37(3): 369-382 (2021)

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