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"Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating ..."

Swarup Bhunia et al. (2008)

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DOI: 10.1007/S10836-008-5072-4

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/et/BhuniaMRR08
Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury, Kaushik Roy:
Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique. J. Electron. Test. 24(6): 577-590 (2008)

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