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"Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism."

Ardy van den Berg et al. (2010)

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DOI: 10.1007/S10836-010-5163-X

access: closed

type: Journal Article

metadata version: 2024-02-05

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  - https://dblp.org/rec/journals/et/BergRMGG10
Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens:
Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism. J. Electron. Test. 26(4): 453-464 (2010)

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