"Test Cycle Count Reduction in a Parallel Scan BIST Environment."

Bechir Ayari, Prab Varma (2000)

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DOI: 10.1023/A:1008304329142

access: closed

type: Journal Article

metadata version: 2020-09-11

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Bechir Ayari, Prab Varma:
Test Cycle Count Reduction in a Parallel Scan BIST Environment. J. Electron. Test. 16(5): 409-418 (2000)

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