"A New BIST-based Test Approach with the Fault Location Capability for ..."

Babak Aghaei et al. (2017)

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DOI: 10.1007/S10836-017-5666-9

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/AghaeiKRB17a
Babak Aghaei, Ahmad Khademzadeh, Midia Reshadi, Kambiz Badie:
A New BIST-based Test Approach with the Fault Location Capability for Communication Channels in Network-on-Chip. J. Electron. Test. 33(4): 501-513 (2017)

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