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"BIST-Based Delay-Fault Testing in FPGAs."

Miron Abramovici, Charles E. Stroud (2003)

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DOI: 10.1023/A:1025126030727

access: closed

type: Journal Article

metadata version: 2020-09-11

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Miron Abramovici, Charles E. Stroud:
BIST-Based Delay-Fault Testing in FPGAs. J. Electron. Test. 19(5): 549-558 (2003)

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