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"A system for identifying an anti-counterfeiting pattern based on the ..."
Zhaohui Zheng et al. (2021)
- Zhaohui Zheng, Hong Zheng, Jianping Ju, Deng Chen, Xi Li, Zhongyuan Guo, Changhui You, Mingyu Lin:
A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions. Expert Syst. Appl. 183: 115410 (2021)
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