"Controlling over-adjusted process means and variances using VSI cause ..."

Su-Fen Yang, Wan-Yun Chen (2009)

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DOI: 10.1016/J.ESWA.2008.08.064

access: closed

type: Journal Article

metadata version: 2017-05-26

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Su-Fen Yang, Wan-Yun Chen:
Controlling over-adjusted process means and variances using VSI cause selecting control charts. Expert Syst. Appl. 36(3): 7170-7182 (2009)

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