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"A test vector selection method based on machine learning for efficient ..."

Hyeong Gu Lim et al. (2023)

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DOI: 10.1016/J.ESWA.2023.120056

access: closed

type: Journal Article

metadata version: 2023-06-02

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Hyeong Gu Lim, Jaeyeon Jang, Byung Kook Ju, Jae-Wook Ko, Chang Ouk Kim:
A test vector selection method based on machine learning for efficient presilicon verification. Expert Syst. Appl. 224: 120056 (2023)

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