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"Measuring the success of retention management models built on churn ..."

Yong Seog Kim, Sangkil Moon (2012)

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DOI: 10.1016/J.ESWA.2012.04.048

access: closed

type: Journal Article

metadata version: 2018-11-14

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  - https://dblp.org/rec/journals/eswa/KimM12
Yong Seog Kim, Sangkil Moon:
Measuring the success of retention management models built on churn probability, retention probability, and expected yearly revenues. Expert Syst. Appl. 39(14): 11718-11727 (2012)

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