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"Semi-supervised support vector regression based on self-training with ..."

Pilsung Kang, Dongil Kim, Sungzoon Cho (2016)

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DOI: 10.1016/J.ESWA.2015.12.027

access: closed

type: Journal Article

metadata version: 2023-03-21

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Pilsung Kang, Dongil Kim, Sungzoon Cho:
Semi-supervised support vector regression based on self-training with label uncertainty: An application to virtual metrology in semiconductor manufacturing. Expert Syst. Appl. 51: 85-106 (2016)

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