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"Decision fusion approach for detecting unknown wafer bin map patterns ..."

Jaeyeon Jang, Gyeong Taek Lee (2023)

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DOI: 10.1016/J.ESWA.2022.119363

access: closed

type: Journal Article

metadata version: 2023-03-19

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Jaeyeon Jang, Gyeong Taek Lee:
Decision fusion approach for detecting unknown wafer bin map patterns based on a deep multitask learning model. Expert Syst. Appl. 215: 119363 (2023)

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