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"Data mining for yield enhancement in semiconductor manufacturing and an ..."

Chen-Fu Chien, Wen-Chih Wang, Jen-Chieh Cheng (2007)

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DOI: 10.1016/J.ESWA.2006.04.014

access: closed

type: Journal Article

metadata version: 2022-10-04

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Chen-Fu Chien, Wen-Chih Wang, Jen-Chieh Cheng:
Data mining for yield enhancement in semiconductor manufacturing and an empirical study. Expert Syst. Appl. 33(1): 192-198 (2007)

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