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"True Random Number Generation by Variability of Resistive Switching in ..."

Simone Balatti et al. (2015)

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DOI: 10.1109/JETCAS.2015.2426492

access: closed

type: Journal Article

metadata version: 2017-05-20

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Simone Balatti, Stefano Ambrogio, Zhongqiang Wang, Daniele Ielmini:
True Random Number Generation by Variability of Resistive Switching in Oxide-Based Devices. IEEE J. Emerg. Sel. Topics Circuits Syst. 5(2): 214-221 (2015)

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