"Burn-in considering yield loss and reliability gain for integrated circuits."

Kyungmee O. Kim (2011)

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DOI: 10.1016/J.EJOR.2011.01.028

access: closed

type: Journal Article

metadata version: 2020-02-21

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Kyungmee O. Kim:
Burn-in considering yield loss and reliability gain for integrated circuits. Eur. J. Oper. Res. 212(2): 337-344 (2011)

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