"Economic lot sampling inspection from defect counts with minimum ..."

Arturo J. Fernández (2017)

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DOI: 10.1016/J.EJOR.2016.10.042

access: closed

type: Journal Article

metadata version: 2023-06-26

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Arturo J. Fernández:
Economic lot sampling inspection from defect counts with minimum conditional value-at-risk. Eur. J. Oper. Res. 258(2): 573-580 (2017)

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