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"Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift ..."

Mengnan Liu et al. (2022)

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DOI: 10.3390/E24070967

access: open

type: Journal Article

metadata version: 2024-05-07

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  - journals/entropy/LiuHXZYTCLY22
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  - https://dblp.org/rec/journals/entropy/LiuHXZYTCLY22
Mengnan Liu, Yu Han, Xiaoqi Xi, Linlin Zhu, Shuangzhan Yang, Siyu Tan, Jian Chen, Lei Li, Bin Yan:
Multiscale Dense U-Net: A Fast Correction Method for Thermal Drift Artifacts in Laboratory NanoCT Scans of Semi-Conductor Chips. Entropy 24(7): 967 (2022)

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