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"Improved low-degree testing and its applications"

Sanjeev Arora, Madhu Sudan (1997)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2022-09-28

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  - electronic edition @ weizmann.ac.il (open access)
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  dblp key:
  - journals/eccc/ECCC-TR97-003
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  persistent URL:
  - https://dblp.org/rec/journals/eccc/ECCC-TR97-003
Sanjeev Arora, Madhu Sudan:
Improved low-degree testing and its applications. Electron. Colloquium Comput. Complex. TR97 (1997)

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