Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Wafer map defect recognition based on deep transfer learning-based densely ..."

Jianbo Yu, Zongli Shen, Shijin Wang (2021)

> Home

Details and statistics

DOI: 10.1016/J.ENGAPPAI.2021.104387

access: closed

type: Journal Article

metadata version: 2022-02-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/eaai/YuSW21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/eaai/YuSW21
Jianbo Yu, Zongli Shen, Shijin Wang:
Wafer map defect recognition based on deep transfer learning-based densely connected convolutional network and deep forest. Eng. Appl. Artif. Intell. 105: 104387 (2021)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.