"Bayesian and Dempster-Shafer reasoning for knowledge-based fault ..."

Kim Verbert, Robert Babuska, Bart De Schutter (2017)

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DOI: 10.1016/J.ENGAPPAI.2017.01.011

access: closed

type: Journal Article

metadata version: 2021-07-31

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Kim Verbert, Robert Babuska, Bart De Schutter:
Bayesian and Dempster-Shafer reasoning for knowledge-based fault diagnosis-A comparative study. Eng. Appl. Artif. Intell. 60: 136-150 (2017)

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