"Reliability analysis and Terahertz characterization of circuit board ..."

Mohana Karthiga Pasumponthevar, Pandia Rajan Jeyaraj (2024)

> Home

Details and statistics

DOI: 10.1016/J.ENGAPPAI.2024.109468

access: closed

type: Journal Article

metadata version: 2024-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/eaai/PasumponthevarJ24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/eaai/PasumponthevarJ24
Mohana Karthiga Pasumponthevar, Pandia Rajan Jeyaraj:
Reliability analysis and Terahertz characterization of circuit board defect employing branchy neural network in edge-cloud fusion architecture. Eng. Appl. Artif. Intell. 138: 109468 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.