"Electromigration Reliability of VLSI Interconnect."

J. Joseph Clement, Eugenia M. Atakov, James R. Lloyd (1992)

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DOI: —

access: open

type: Journal Article

metadata version: 2023-01-23

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J. Joseph Clement, Eugenia M. Atakov, James R. Lloyd:
Electromigration Reliability of VLSI Interconnect. Digit. Tech. J. 4(2): 114-125 (1992)

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