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ORCID"Electromigration Reliability of VLSI Interconnect."
J. Joseph Clement, Eugenia M. Atakov, James R. Lloyd (1992)
- J. Joseph Clement, Eugenia M. Atakov, James R. Lloyd:
Electromigration Reliability of VLSI Interconnect. Digit. Tech. J. 4(2): 114-125 (1992)
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