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"A Metric to Target Small-Delay Defects in Industrial Circuits."

Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty (2011)

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DOI: 10.1109/MDT.2011.26

access: closed

type: Journal Article

metadata version: 2022-01-03

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  dblp key:
  - journals/dt/YilmazTC11
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  persistent URL:
  - https://dblp.org/rec/journals/dt/YilmazTC11
Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty:
A Metric to Target Small-Delay Defects in Industrial Circuits. IEEE Des. Test Comput. 28(2): 52-61 (2011)

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