"Built-In EVM Measurement With Negligible Hardware Overhead."

Ender Yilmaz, Afsaneh Nassery, Sule Ozev (2014)

> Home

Details and statistics

DOI: 10.1109/MDAT.2013.2265164

access: closed

type: Journal Article

metadata version: 2020-03-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/dt/YilmazNO14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/YilmazNO14
Ender Yilmaz, Afsaneh Nassery, Sule Ozev:
Built-In EVM Measurement With Negligible Hardware Overhead. IEEE Des. Test 31(1): 75-82 (2014)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.