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"LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing ..."

Yuta Yamato et al. (2013)

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DOI: 10.1109/MDT.2012.2221152

access: closed

type: Journal Article

metadata version: 2020-03-13

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  dblp key:
  - journals/dt/YamatoMKWWK13
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  persistent URL:
  - https://dblp.org/rec/journals/dt/YamatoMKWWK13
Yuta Yamato, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, Michael A. Kochte:
LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing. IEEE Des. Test 30(4): 60-70 (2013)

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