"Replacing Error Vector Magnitude Test with RF and Analog BISTs."

Dallas Webster, Rick Hudgens, Donald Y. C. Lie (2011)

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DOI: 10.1109/MDT.2011.1

access: closed

type: Journal Article

metadata version: 2020-05-17

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Dallas Webster, Rick Hudgens, Donald Y. C. Lie:
Replacing Error Vector Magnitude Test with RF and Analog BISTs. IEEE Des. Test Comput. 28(6): 66-75 (2011)

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