"Tackling Test Challenges for Interposer-Based 2.5-D Integrated Circuits."

Ran Wang, Krishnendu Chakrabarty (2017)

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DOI: 10.1109/MDAT.2017.2705077

access: closed

type: Journal Article

metadata version: 2020-03-13

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Ran Wang, Krishnendu Chakrabarty:
Tackling Test Challenges for Interposer-Based 2.5-D Integrated Circuits. IEEE Des. Test 34(5): 72-79 (2017)

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