"Noise Problems in Testing VLSI Hardware."

Kofi E. Torku, Dave A. Kiesling (1985)

> Home

Details and statistics

DOI: 10.1109/MDT.1985.294795

access: closed

type: Journal Article

metadata version: 2021-03-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/dt/TorkuK85
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/TorkuK85
Kofi E. Torku, Dave A. Kiesling:
Noise Problems in Testing VLSI Hardware. IEEE Des. Test 2(6): 36-43 (1985)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.